SN74ABT8245DWR
Texas Instruments
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PART DESCRIPTION:
IC SCAN TEST DEV W/OBT 24-SOIC
PART CATEGORY:
EE All Parts
| Part # | Manufacturer | Description | Stock | Price | Buy |
|---|---|---|---|---|---|
SN74ABT8245DWR |
TI | 2000 | Buy Now |
